Surface Profilometer
Application:
* Measurement of surface profile in one dimension with 50 nm accuracy
* Measurement of surface roughness
* Measuring the thickness of step layers
* A practical product in the field of solar cell research and thin film laboratories
Product Introduction:
A profilometer is a surface profile measuring device using a moving tip. In this device, the tip moves with a variable speed and an adjustable distance on the sample’s surface, and a capacitive sensor measures the displacement of the tip in the z-direction. The measurement accuracy in the z direction is better than 50 nm. The profile of various samples, including metal, glass, plastic, and coatings, can be measured. In places of the sample where there is a sharp step of the layer, the profilometer can measure the height of the step and declare the thickness of the layer.
Technical Specifications:
Model
* PFM-6020
* PFM-6040 Measurment technique Contact with Stylus profiling Profilometric measurement 1D surface profile measurement Camera view type
* 640 × 480pixel, 500-50X Magnification, Focusable
* digital camera Stylus sensor Capacitive displacement sensor Stylus approach Automated stylus approach system Sensor calibration Automatic calibration system Stylus movement Motorized movement of x and z axis Maximum wafer size 120 mm Growth length 3 cm Data points per scan Max. 10,000 X-Scan steps 1.3 μ
| Company | |
|---|---|
| Type | This product is a final B2B equipment. |
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