Transmission Electron Microscopes (TEM)
Application:
* Determining the growth direction of crystalline materials and crystal plates
* Determining crystal defects and grain boundaries
* Detecing areas with residual stress
* Identifying the chemical composition of inorganic phases
Product Introduction:
Transmission electron microscopes (TEM) are specific tools to determinine the structure and morphology of materials, which makes microstructural studies of materials with high resolving power and very high magnification possible.
In addition, these microscopes can be used to study crystal structures, symmetry, crystal defects and orientation. These applications have made TEM a significant tool in many advanced researches in physics, chemistry, crystallography, materials science, and biology. TEM is capable of imaging the microstructure of materials with a magnification of 1,000 to 1,000,000 times with a resolving power of less than 1 nm. TEM is also capable of elemental analysis, determining the structure and crystal direction of components as small as 30 nanometers both qualitatively and quantitatively.
Technical Specifications:
|
Resolution (nm) at 80 KV |
٭ Point: 0.50 ٭ Meshy: 0.34 |
|
Acceleration Voltage |
٭ Range: 50KV × 80KV ٭ Stability: 10-6 × 8 |
|
Magnification |
٭ Range: 150X to 400,000X ٭ Steps: 16 |
|
Refraction |
٭ >1.5 μm diameter, selected apertures (SAD) ٭ >3 μm diameter, selected by micro-beam illumination |
|
Projector Lenses |
٭ Number of lenses: 3 factory level electromagnetic projector lenses ٭ Stability: 10-6 × 6 |
| Company | |
|---|---|
| Type | This product is a final B2B equipment. |
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